| Belief : In the design of sophisticated digital systems, 
    elegance is not a dispensable luxury but a matter of life and death, being a 
    major factor that decides between success and failure. - E. W. Dijkstra
 Objective : The VLSI design productivity crisis, that is, the 
    fact that the number of available transistors grows much faster than the 
    ability to design them meaningfully, has become the greatest threat to the 
    growth of semiconductor industry. Silicon complexity, which refers to the 
    impact of previously ignorable physical phenomena, is at the center of this 
    crisis. Based on our beliefs that the only effective way to improve 
    productivity is to maintain design complexity at a manageable level, and 
    that formal methods are the right techniques for complexity control, the 
    objective of this research is to improve design productivity by applying 
    formal methods to silicon complexity problems such as inductive/capacitive 
    couplings and process variability.
 
 The research develops methodology, models, and algorithms to handle silicon 
    complexity through the application of formal methods. By treating timing 
    analysis as extracting semantics of a circuit, a timing analysis system is 
    developed that handles both inductive and capacitive coupling delay 
    variations. The system develops and uses a range of inductive coupling 
    models with different accuracy and complexity. Based on that, timing 
    macro-models for coupling delays are created for library characterization 
    and IP specification. Clock scheduling and retiming algorithms are developed 
    to separate signal switching times for coupling delay optimization. Signal 
    switching time information is also explored in routing and placement to 
    minimize coupling between sensitive wires. For process variability, 
    statistical models are developed and combined into the timing analysis 
    system to compute the statistical performance of a circuit, and stochastic 
    optimization is used to optimize the statistical performance. The integrated 
    education activities aim at two aspects of computer engineering education: 
    1) educating students in formal methods, especially their applications to 
    nanometer VLSI design, thus bringing needed mathematical rigor into the 
    discipline; 2) introducing students to silicon complexity and its impacts on 
    VLSI design so that they are equipped with necessary background for modern 
    high performance VLSI design.
 Contact :NuCAD Research Laboratory
 Department of Electrical Engineering and Computer Science, M 314
 Technological Institute, Northwestern University
 2145 Sheridan Road, Evanston, IL 60208, USA
 Telephone : +1-847-491-9925
 Email : haizhou AT eecs DOT northwestern DOT edu
 Web : 
    http://www.ece.northwestern.edu/nucad
 
 
 Copyright @ 
    NuCAD, EECS, Northwestern University, Evanston, IL 60208, USAComments or questions - Please contact haizhou AT eecs DOT northwestern DOT 
    edu
 Last updated
    April, 2008
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