<!DOCTYPE HTML PUBLIC "-//IETF//DTD HTML 2.0//EN"><!--Converted with LaTeX2HTML 96.1-h (September 30, 1996) by Nikos Drakos (nikos@cbl.leeds.ac.uk), CBLU, University of Leeds -->COURSE TITLE: ECE 353 Digital Microelectronics

 

CATALOG DESCRIPTION:  Logic families, comparators, A/D and D/A converters, combinational systems, sequential systems, solid-state memory, large-scale integrated circuits, and design of electronic systems.

 

REQUIRED TEXTS:  J. Rabaey, A. Chandrakasan, and B. Nikolic, Digital Integrated Circuits, a Design Perspective, Prentice-Hall, Upper Saddle, NJ, 2nd edition, 2003.

 

REFERENCE TEXTS:

1.  Burns, S. G. and Bond, P. R., Principles of Electronic Circuits, PWS Publishing Co., Boston, MA, 1997.

2.  P. W. Tuinenga, SPICE, Prentice Hall, 1995.

 

COURSE COORDINATOR: Alan V. Sahakian

 

COURSE GOALS: To teach the analysis and design of electronic circuits and systems that realize logic functions.  Topics include interface circuits, A/D, D/A conversion circuits, dynamic and static memory and memory systems.  Interconnection considerations such as the calculation of fan-out, noise margin, interconnection delay, and transmission-line effects are stressed.  Techniques for calculating the reliability of complex electronic systems based on Military Handbook 217-E are introduced.

 

PREREQUISITES: ECE 203 and ECE 225

 

PREREQUISITES BY TOPIC:

1.      Circuit analysis

2.      Physical electronics

3.      Active devices/circuits including BJTs, FETs, and amplifiers

4.      Fundamentals of logic design and computer organization

 

DETAILED COURSE TOPICS

 

  1. Introduction, review of devices and their properties
  2. Bipolar families
  3. CMOS
  4. Very high performance (Schottky, BiCMOS,IIL, etc.)
  5. Tri-state logic, bus design
  6. Memory technology
  7. Parasitics, transmission-line effects, packaging
  8. Analog to Digital interfaces
  9. Linear and switching mode power conversion

 

COMPUTER USAGE: P-Spice is used for circuit modeling.


 

LABORATORY PROJECTS:

 

LAB #1: Measurement of Logic Family Voltage Transfer Characteristics

LAB #2: Measurement of High-Speed Switching Characteristics of Various Logic Families

LAB #4: Reliability Experiment -- Design and Testing of a Single-Error-Correcting Channel

LAB #5: A Simple Dynamic RAM

LAB #6: Transmission-Line Effects in High-Speed Logic Systems

 

GRADES:

There will be one midterm and a final exam.  These will be based on the lectures, textbook readings, handouts, assignment problems, and the laboratory work.  Tentatively, the final grade for the course will include the midterm exam, the final exam, homework problems and lab work with equal weights (25% each).

 

COURSE OBJECTIVES:  When a student completes this course, s/he should be able to:

  1. Understand the principles of operation of several logic families, including complementary CMOS, pseudo NMOS, dynamic logic, ECL, and DTL.
  2. Analyze a given gate design for the important dc and ac parameters, including the voltage transfer characteristic, the corner voltages and noise margins, the fanout or output transition waveform under load, the power dissipation, and the propagation delay.
  3. Design gates in several MOS families, including transistor sizing.
  4. Evaluate the reliability of an electronic system, including those incorporating redundant elements, using the methods of Military Handbook 217E.
  5. Design simple D/A and A/D converters.
  6. Predict waveforms in systems involving logic gates and transmission lines.
  7. Understand the principles of operation of static and dynamic RAM, and various forms of ROM.
  8. Operate a modern high-speed oscilloscope including compensating the probe, adjusting for the correct trigger operation, and making quantitative measurements of both voltages and times.
  9. Be able to debug small hardware logic systems.

 

ABET CONTENT CATEGORY:  100% Engineering (Design component).